Principles and Techniques of Transmission Electron Microscopy
BOT/MBIO/ZOO 5364 – Tentative Syllabus – Fall 2007
Samuel Roberts Noble Electron Microscopy Web site: http://www.ou.edu/research/electron/
SRNEML Laboratory Phone: 325-4391
D2L Class Website:
Instructors:
Scott Russell, GLC Professor, and Director Office: 210 NML e-mail: srussell@ou.edu
Preston Larson, Research Scientist Office: 205E NML e-mail: plarson@ou.edu
Greg Strout, Electron Microscopist Office: 214 NML e-mail:
gstrout@ou.edu
Lecture: MWF 8:30-9:20 am
Laboratory: TBS, TEM: TBS
Textbooks for Reference:
Materials: D. B. Williams and C. B. Carter, “Transmission Electron Microscopy: A Textbook for Material Scientists”, (1996). ISBN 0-306-45247-2 (Hardcover).
Biologicals: J. J. Bozzola and L. D. Russell, “Electron Microscopy:
Principles and Techniques for Biologists”, 2nd ed. (1999). ISBN 0-7637-0192-0 (Hardcover).
Tentative Course Schedule
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Week |
Date |
Lecture |
Readings/Assignments |
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Week 1 |
Aug. 20 |
Course content, requirements, grading system, lab rules, lab tour, equipment scheduling, TURN IN SCHEDULES |
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Aug. 22 |
History, Basics of Microscopy, TEM, SEM, LM Overview |
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Aug. 24 |
Basics of Optics, Lens Construction, Aberrations, Imaging Defects |
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Week 2 |
Aug. 27 |
Vacuum Theory, Pumps, Gauges, Vacuum System Design |
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Aug. 29 |
Vacuum Completed; Electron Sources, Gun Design |
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Aug. 31 |
Electron Sources and Gun Design |
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Week 3 |
Sep. 3 |
Labor Day |
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Sep. 5 |
Beam Specimen Interactions |
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Sep. 7 |
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Week 4 |
Sep. 10 |
TEM Imaging Modes: Imaging Principles, Resolution, Brightfield, Ray Paths |
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Sep. 12 |
TEM Imaging Modes: Diffraction, Crystallographic Overview, Ray Paths |
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Sep. 14 |
TEM Imaging Modes: Darkfield Imaging Types, Limitations, Principles |
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Week 5 |
Sep. 17 |
Preparation: Introduction to Direct Methods, Substrate Preparations, Replicas |
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Sep. 19 |
Biological Specimen Preparation; Ultramicrotomy |
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Sep. 21 |
Demo: Support Films (GS) |
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Week 6 |
Sep. 24 |
Materials Specimen Prepation |
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Sep. 26 |
Individual Class Projects |
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Sep. 28 |
Individual Class Projects |
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Week 7 |
Oct. 1 |
Freezing Technologies |
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Oct. 3 |
Freeze Fracture |
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Oct. 5 |
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Week 8 |
Oct. 8 |
Stereology and Numerical Analysis |
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Oct. 10 |
Introduction to EELS |
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Oct. 12 |
Quantitative EELS |
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Week 9 |
Oct. 15 |
TEM Imaging |
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Oct. 17 |
TEM Imaging |
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Oct. 19 |
Intermediate and High Voltage TEM |
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Week 10 |
Oct. 22 |
Energy Dispersive Spectroscopy |
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Oct. 24 |
Energy Dispersive Spectroscopy |
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Oct. 26 |
Energy Dispersive Spectroscopy |
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Week 11 |
Oct. 29 |
Electron Energy Loss Spectroscopy |
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Oct. 31 |
Electron Energy Loss Spectroscopy |
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Nov. 2 |
OMS/OAS Meeting |
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Week 12 |
Nov. 5 |
Image Interpretation and Artifacts |
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Nov. 7 |
Image Interpretation and Artifacts |
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Nov. 9 |
Stereology |
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Week 13 |
Nov. 12 |
Stereology |
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Nov. 14 |
High Resolution TEM |
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Nov. 16 |
High Resolution TEM |
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Week 14 |
Nov. 19 |
High Resolution TEM |
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Nov. 21 |
Thanksgiving |
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Nov. 23 |
Thanksgiving |
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Week 15 |
Nov. 26 |
Poster Making |
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Nov. 28 |
Projects/Poster |
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Nov. 30 |
Projects/Poster |
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Week 16 |
Dec. 3 |
Projects/Poster |
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Dec. 5 |
Projects/Poster |
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Dec. 7 |
Projects/Poster |
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December 7th Last Day of Classes |
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December 10-14 Finals Week |
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Tuesday, December 11 10:30 am-12:30 pm Final Exam/Poster presentations |
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Fall 2007 Academic Calendar: http://admissions.ou.edu/fall2007calendar.htm
Final Examination Schedule and Rules: http://admissions.ou.edu/finals.htm
FINAL PROJECTS
Projects are due 10:30 AM on Tuesday December 11th. Briefly, the project involves:
− A poster suitable for scientific competition.
− A 15 (MAX) minute oral presentation explaining the project and poster. The oral presentation should include sufficient introductory information that the audience gains an understanding of the scientific significance of the project. The audience will be provided with critique sheets.
− Poster guidelines will be discussed in class.
STIGMATION MICROGRAPHS
Stigmation photographs are due on or before December 7th. Up to three sets of stigmation images may be turned in and only the highest grade will count. The first set will be due on October 26th with the final set due on or before December 7th. The stigmation micrographs consist of:
− Using a holey carbon grid, take three images (overfocus, focus, and underfocus) of a hole at 125,000X.
EQUIPMENT CHECK-OUT
Note: It is recommended that you begin working on your project prior to completing your checkout.
Zeiss 10: Checkouts begin on October 8th
If a need exists for you to use the JEOL 2000 (e.g. higher resolution), consult the instructor to discuss the possibility of training on this machine. Training on the JEOL 2000 will be based on research needs, competence (partly based on the Zeiss 10 checkouts), time constraints, and the discretion of the EML personnel.
JEOL 2000: Checkouts will be conducted at the discretion of EML personnel.
Lengths of the checkouts are variable but plan on allotting around 4 hours. Checkouts on both TEMs will consist of the following parts:
− System Description
− Operation and Alignment
− Trouble-shooting
Other Equipment: Supervised operation until competent.
User’s List
A list of users of EML equipment and the instruments they are qualified to use is maintained by the lab. DO NOT USE any equipment on which you have not been checked out. Only EML personnel are to train individuals on the use of EML equipment.
Online schedule
The sign-up and schedule for the Zeiss 10 is located online at: http://www.microscopy.ou.edu/schedule/sched.cgi?fac=Zeiss10TEM
The sign-up and schedule for the
JEOL2000 is located online at: http://www.microscopy.ou.edu/schedule/sched.cgi?fac=JEOL2000FX
Consult EML personnel before scheduling equipment use.
GRADING
Grading in the course will be broken down as follows:
Exam 1 20%
Exam 2 20%
Stig Series 10%
Checkouts 20%
Final Project/Poster Presentation 30%
Total 100%