Principles and Techniques of Transmission
Electron Microscopy
MBIO 5364 – Tentative
Syllabus – Fall 2015
Samuel
Roberts Noble Microscopy Laboratory Web site:
http://www.microscopy.ou.edu/
SRNEML
Laboratory Phone: 325-4391
D2L Class Website:
Instructors:
Scott Russell, GLC Professor, and Director Office: 210 NML e-mail:
srussell@ou.edu
Preston Larson, Research Scientist Office:
205E NML e-mail: plarson@ou.edu
Greg Strout, Electron Microscopist Office:
214 NML e-mail: gstrout@ou.edu
Lecture:
MWF 8:30-9:20 am NML room 212
Laboratory:
TBD, TEM: NML room 203
Textbooks for Reference (choose ONE,
depending on research interests):
Material
Sciences: D. B. Williams and C. B. Carter,
“Transmission Electron Microscopy: A
Textbook for Material Scientists” (1996) Plenum Press, New York, NY. ISBN 0-306-45247-2
(Hardcover). - OR - D. B. Williams and C. B. Carter, “Transmission
Electron Microscopy, 2nd edition” (2009) Springer Verlag,
New York, NY. ISBN 978-0-387-76500-6
(Hardcover) 837 pp. $149, 978-0-387765020
(Softcover) $99 (also Kindle Edition $43.06)
(Amazon has new copes of these for $81.88 and $64.99, respectively, on
8/19/2015)
Biological
Sciences: J. J. Bozzola and
L. D. Russell, “Electron Microscopy:
Principles and Techniques for Biologists”, 2nd ed. (1999),
Jones & Bartlett. ISBN
0-7637-0192-0 (Hardcover), pp $145.00 retail $49.21 used. (Amazon has
new copies at retail as of 8/19/15, used are less)
(http://books.google.com/books?id=zMkBAPACbEkC&pg=PR4&lpg=PR4&dq=ISBN+0-7637-0192-0)
Tentative Course Schedule (as of 10/6/15)
Week |
Date |
Lecture |
Week 1 |
Aug. 24 |
Course content,
requirements, grading, lab rules, lab tour, Intro to Electron Microscopy (SR) |
Aug. 26 |
Instrument, Gun, and
Optical Principles (PL) |
|
Aug. 28 |
Instrument, Gun,
and Optical Principles (PL) |
|
Week 2 |
Aug. 31 |
Instrument Training
Session #1 (GS) |
Sept. 2 |
Instrument Training
Session #2 (GS) |
|
Sept. 4 |
Instrument Training
Session #3 (GS) |
|
Week 3 |
Sept. 7 |
Labor Day |
Sept. 9 |
Electromagnetic
Lenses & Optics (SR) |
|
Sept. 11 |
Electromagnetic
Lenses & Optics (SR) |
|
Week 4 |
Sept. 14 |
Vacuum Systems
& Technology (SR) |
Sept. 16 |
Materials Specimen
Preparation (PL) |
|
Sept. 18 |
Electron Sources
(PL) |
|
Week 5 |
Sept. 21 |
Support Film,
Replicas, Shadow Casting (SR) |
Sept. 23 |
Life Sciences Prep
/ Ultramicrotomy (SR) |
|
Sept. 25 |
Beam Specimen
Interactions (PL) |
|
Week 6 |
Sept. 28 |
Completion of Above
Topics and Review |
Sept. 30 |
Exam 1 (Room 40 in
GLCH) |
|
Oct. 2 |
Individual Class
Projects |
|
Week 7 |
Oct. 5 |
Energy Dispersive
Spectroscopy (PL) |
Oct. 7 |
Energy Dispersive
Spectroscopy (PL) |
|
Oct. 9 |
Dallas Football
Weekend (no class) |
|
Week 8 |
Oct. 12 |
Electron Energy
Loss Spectroscopy (PL) |
Oct. 14 |
Imaging and
Introduction to Interpretation (SR) |
|
Oct. 16 |
Image
Interpretation and Artifacts (SR) |
|
Week 9 |
Oct. 19 |
Freezing
Technologies/Freeze Fracture (SR) |
Oct. 21 |
End Fracture/Cryoultramicrotomy (SR) |
|
Oct. 23 |
High Voltage EM
& Electron Tomography (SR) |
|
Week 10 |
Oct. 26 |
TEM Imaging Modes:
Imaging Principles, Resolution, Ray Paths (PL) |
Oct. 28 |
TEM Imaging Modes: Diffraction,
Bright Field, Dark Field, STEM, HAADF (PL) |
|
Oct. 30 |
High Resolution TEM
(PL) |
|
Week 11 |
Nov. 2 |
Digital Imaging
(GS) |
Nov. 4 |
Quantitative
Microscopic Analysis and Stereological Methods (SR) |
|
Nov. 6 |
Complete Lectures
and Review Session |
|
Week 12 |
Nov. 9 |
Exam 2 (Room 40 in GLCH) |
Nov. 11 |
||
Nov 13 |
OAS Fall Meeting @ Oklahoma City University at 2501 N Blackwelder Ave, OKC |
|
Weeks 13-16 |
Nov 13-Dec 15 |
Poster Making / |
Fall
2015 Academic Calendar:
http://www.ou.edu/content/admissions/academic_calendar/fall-2015.html
Final Examination
Schedule and Rules:
http://www.ou.edu/content/enrollment/final_exams.html
INSTRUCTIONAL GOALS OF THE COURSE
The goal of the course, Transmission Electron
Microscopy (TEM), is to develop within students
appreciation and operational ability to conduct independent research using a
transmission electron microscope as well as an understanding of the principles
underlying and preparation of materials for observation using TEM. This course combines study of physical and optical
principles underlying TEM, as well as hands-on training, operational
procedures, basic trouble-shooting and alignment of the Zeiss
10 TEM. As part of the course, each
student will conduct a research project using a transmission electron
microscope and preparatory equipment in the NML to prepare their own
material. The course will be graded by
the student’s ability to take written examinations, focus and stigmation of model specimens, demonstrate practical and
operational knowledge of the operation of the transmission electron microscope
through written and oral examinations including operation and trouble-shooting,
and presenting their research results in a poster and class presentation. At the end of the course, the student will
have practical and applied knowledge of transmission electron microscopy in the
physical and biological sciences and be able to prepare samples and operate a
transmission electron microscope.
FINAL PROJECTS
Projects
are presented in lieu of a final examination.
All projects are due at the final:
10:30
AM on Wednesday, December 16, 2015
Briefly,
the project involves:
STIGMATION
MICROGRAPHS
Final stigmation/focus
series photographs are due on or before December 11th. Up to three sets of stigmation/focus
series images may be turned in and only the highest grade will count. The first set will have a target due date of October 31st with the second
target date of November 21 and final
set due on December 11th. The stigmation
micrographs consist of:
EQUIPMENT CHECK-OUT
Zeiss 10: Checkouts tentatively begin on October 12th Check-outs may include both a written and
oral/hands-on component. The length of
an individual student’s checkout is variable depending on their knowledge of
the microscope, principles of electron microscopy and operational skill, but
plan on allotting around 4-6 hours.
Checkouts on both TEMs will stress the following:
If a need exists for
you to use the JEOL 2000FX (e.g. higher
resolution), consult the instructor to discuss the possibility of training on
this machine. Training on the JEOL
2000FX will be based on research needs, competence (partly based on the Zeiss 10 checkouts), time constraints, and the discretion
of NML personnel.
JEOL 2000FX: Checkouts will be conducted at the discretion
of NML personnel.
Other Equipment: Users must be
checked out to use expensive pieces of preparatory equipment. Contact NML personnel for training. To keep training consistent, non-NML personnel are not permitted to conduct separate training. Supervised operation is required until you
are competent and checked out.
User’s List: A list of users of
NML equipment and the instruments they are qualified to use is maintained by
the lab. DO NOT USE any equipment on
which you have not been checked out.
Only NML personnel are to train individuals on the use of NML equipment.
Note: It is
recommended that you begin working on your project prior to completing your checkout.
Online schedule. The sign-up sheet and
schedules for the Zeiss 10 and JEOL 2000 are located
online at: http://www.microscopy.ou.edu/schedule/index.cgi
You will be entered
into the system when you become knowledgeable and independent enough to use the
microscope without EM personnel present.
Consult NML personnel before scheduling equipment use.
GRADING
Grading in the course will be broken down as
follows:
Exam 1 20%
Exam 2 20%
Stigmation & Focus Series 5%
Checkouts 15%
Final Project/Poster
Presentation 40%
Total 100%
POLICY
All OU students are governed by the policies
of the University of Oklahoma that are currently in force. Policies are provided online at URL: http://catalog.ou.edu/current/Policies.htm
and include all associated links and references from that page. Particularly, these include the OU Student
Code (http://www.ou.edu/content/dam/studentlife/documents/AllCampusStudentCode.pdf)
and the Academic Misconduct Policy (http://integrity.ou.edu/),
to name the two most important references.
Any and all instances of Academic Misconduct threaten the quality of
students’ learning experiences and therefore are given special scrutiny by the
university.
All of these stated
policies are incorporated into this syllabus by this reference. It is ultimately the student’s responsibility
to be aware of current and changing policies over the course of their academic
career. All participants in the course
are bound by these policies.