Innovations in Instrumentation for Materials Science

Symposium AA at the 1996 Spring Meeting of the Materials Research Society

April 8 to 12, 1996, San Francisco, California, USA


We are in the midst of an explosion in new technologies for microscopy, spectroscopy, data analysis, sample manipulation and more. The materials community is central to much of this activity and both drives and embraces these developments. The need for new instrumentation is especially poignant now with the increasing need to understand materials on the atomic scale and with greater precision in physical properties measurements. This symposium will concentrate on the innovations and the people who develop the innovations. Analytical characterization of materials including at least imaging, elemental composition, chemical properties, and mechanical testing on a microscopic scale will be considered.

To our knowledge, there has never been a symposium which specifically seeks to bring together the developers of the instrumentation for the purpose of reviewing the latest innovations in the technology. We expect both the developers and users of instrumentation to be interested in this symposium. Academic, industrial, and commercial groups developing either systems or components which advance the state of instruments used for materials research are invited to participate. We expect a cross-fertilization among several communities. Examples of topics of interest include:

  1. System Components
  2. Integrated Systems
  3. Enabling Instrumentation and Manufacturing

Invited speakers include: Ruud Tromp (IBM Watson Research Laboratory), Pupa De Stasio (Swiss Institute of Technology), Noel MacDonald (Cornell Univeristy), Ronald Gronsky (University of California - Berkeley), Ondrej Krivanek (Gatan), Kamal Soni (University of Chicago), Jon McCarthy (NORAN Intruments), Heiner Jaksch (Zeiss), David Williams (Lehigh), Hans Hallen (North Carolina State University), Franco Cerrina (University of Wisconsin), Michael Miller (Oak Ridge National Laboratory), Jan Ringnalda (Philips), Warren Oliver (Nano Instruments Inc.), and more.

It is expected that some exceptional contributed papers will be upgraded to longer, invited presentations.

Symposium Organizers:

Thomas F. Kelly
Dept. Materials Science & Eng.
University of Wisconsin
1500 Engineering Drive
Madison, WI   53706-1607
Phone:	608 263-1073
Fax:	608 263-1087
tfkelly@engr.wisc.edu

Paul E. Fischione
E. A. Fischione Instruments, Inc.
9003 Corporate Circle
Export, PA   15632
Phone:	412 325-5444
Fax:	412 325-5443
paul.fischione@internetmci.com

Lorretta Inglehart
National Science Foundation
Division of Materials Research
4201 Wilson Boulevard, 1065 S
Arlington, VA   22230
Phone:	703 306-1817
Fax:	703 306-0515
lingleha@nsf.gov

David B. Williams
Dept. Materials Science & Eng.
Lehigh University
Whitaker Lab #5,
5 E. Packer Ave.
Bethlehem, PA   18015-3195
Phone:	610-758-4224
Fax:	610 758-4244
dbw1@lehigh.edu

****************************************************
Abstract Model - 1996 Spring Meeting
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Symposium Title: 	Innovations in Instrumentation for Materials Research
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Thomas F. Kelly           Internet: tfkelly@engr.wisc.edu
University of Wisconsin   Phone: 608 263-1073
1500 Johnson Drive        Fax:   608 263-3704 or 3-1087
Madison, WI   53706-1687