P. C. Cheng, SUNY, Buffalo, New York
This non-commercial, technical workshop will be a forum to learn about confocal microscopy and 3-D imaging. Equipment designers, engineers and scientists will present papers.
R. Albrecht, University of Wisconsin, Madison, Wisconsin
This course will provide information on the use of colloidal gold in studies requiring qualitative and/or quantitative labeling of biological material.
D. Joy, University of Tennessee, Knoxville, TN; D. Howitt, University of California, Davis, CA; J. Armstrong, California Institute of Technology, Pasadena, CA; C.G. Cleaver, GE- VNC, Pleasanton, CA; R. Geiss.
This course will consist of four segments: An introduction to the theory and operation of the SEM, x-ray analysis in the SEM, an introduction to special SEM techniques for microelectronics, and crystallographic and topographic studies of devices and structures in the SEM.
D. E. Newbury, NIST, Gaithersburg, Maryland
NIST Desktop Spectrum Analyzer (DTSA) is a comprehensive software engine for collection, interpretation, quantitative analysis, and simulation of electron-excited x-ray spectra.
J. M. Mackenzie, Jr., North Carolina State University, Raleigh, North Carolina
Three major topics will be covered in this course. Archiving and sharing images, strategies for digital signal acquisition, and evaluation of frame stores and image display devices.
Atomic Force/Scanning Tunneling Microscopy Symposium I
Atomic Force/Scanning Tunneling Microscopy Symposium II (cont.)
Low Pressure Scanning Electron Microscopy
S. Seraphin, University of Arizona, Tucson, Arizona
The course will familiarize the professional materials scientist with a variety of modern specimen preparation methods for TEM analysis.
Atomic Force/Scanning Tunneling Microscopy Symposium III
Electron/Instrument Interaction Modeling in the Scanning Electron Microscope - A Symposium
Field Emission SEM in Biology
Atomic Force/Scanning Tunneling Microscopy Symposium IV (cont.)
Electron/Instrument Interaction Modeling in the Scanning Electron Microscopy - A Symposium (continued)
Cryo-SEM
Computerized SEM Training and Use Including Remote Operation
Pharmaceutics: Biological and Physical Applications
Semiconductors
In situ Hybridization and In Situ PCR
Semiconductors (continued)
Biomaterials
Session: Confocal I
Date and Time: AM Wednesday, April 10
Co-Chairs: J. B. Pawley, University of Wisconsin
Room 1235, Engineering Research Bldg.
1500 Johnson Drive, Madison, WI 53706
P. C. Cheng
Advanced Microscopy & Imaging Lab
Dept. Electrical & Computer Engineering
State University of New York, Buffalo
Buffalo, NY 14260
J. B. Pawley, University of Wisconsin, Madison, WI
"CCD-like Photodetectors to Replace the PMT in the Confocal Microscope"
T. Wilson, University of Oxford, Oxford, U.K.
"White Light Confocal Microscopy"
P.C. Cheng, State University of New York, Buffalo, NY
"2- and 3-photon Excitation"
Session: Confocal II - 3-D Microscopy of Living Cells
Date and Time: PM Wednesday, April 10
Co-Chairs: J. B. Pawley, University of Wisconsin
Room 1235, Engineering Research Bldg.
1500 Johnson Drive, Madison, WI 53706
P. C. Cheng, Advanced Microscopy & Imaging Lab
Dept. Electrical & Computer Engineering
State University of New York, Buffalo, Buffalo, NY 14260
P. Goodwin, Fred Hutchins Cancer Research Center, Seattle, WA
"WF-deconvolution vs. Confocal for Live Cell Imaging"
M. Petroll, University of Texas Southwestern Medical Center, Dallas, TX
"Application of Quantitative Image Analysis Techniques to In Vivo Confocal Microscopy of
the Cornea"
S. Myrdal, Bristol-Myers Squibb, Seattle, WA
"Following Fluorescent Tracer Materials in Live Cell"
Session: Scanning Electron Microscopy and Microanalysis of Biomaterials
Date & Time: PM Friday, April 12
Chair: Patrick Frayssinet
Bioland Inc.
132 Route d'Espagne
31100 Toulouse, France
Tel: 011-33-62-200395, Fax: 011-33-62-200346
Session: Low Pressure Scanning Electron Microscopy
Date & Time: PM Wednesday, April 10
Chair: David A. Smith
Director of EM Facility
Material Science & Engineering
Room #458
Lehigh University
5 East Packer Avenue
Bethlehem, PA 18105-3195
Session: Pharmaceutics: Biological and Physical Applications
Date and Time: AM Friday, April 12
Chairs: A. Angel
Boehringer Ingelheim Pharmaceuticals, Inc.
Research and Development
900 Ridgebury Road, Box 368
Ridgefield, CT 06877
Steven Samuelsson
Procter & Gamble Pharmaceuticals, Inc.
Woods Corners Facility
Norwich, NY 13815
Session: Computerized SEM Training and Use Including Remote Operation
Date & Time: PM Thursday, April 11
Chair: Judy A. Murphy
San Joaquin Delta College
Microscopy Department
5151 Pacific Avenue
Stockton, CA 95207
N. Fegan, California State University, Hayward, CA
"Remote SEM Operation for CSU System"
Session: Food Structure and Functionality
Date & Time: AM & PM Friday, April 12
Co-Chairs: Paula Allan-Wojtas
Centre for food and Aninal Research (CFAR)
Agriculture and Agri-Foods Canada
Central Experimental Farm
Ottawa, Ontario Canada K1A OC6
J. Joseph Yun, Ph.D.
Diversified Research Laboratories Limited
1047 Yonge Street
Toronto, Ontario, Canada M4W 2L2
Dr. Samuel H. Cohen
Research Physical Scientist
SURD, R315
U.S. Army Natick RD&E Center
Natick, MA 01760-5020
M. Rosenberg, University of California, Davis, CA
"Microstructure and Microporosity of Spray Dried Microcapsules"
B. E. Brooker, Institute of Food Research, Reading, U.K.
"Replacement of Bakery Shortenings by Fat Crystals"
D. W. Irving, USDA Western Research Center, Albany, CA
"Distribution of Lipids in Various Oat Lines"
J.E. Charbonneau, National Food Processors Association, Washington D.C.
"Recent Case Histories of Food Product Container Interactions Using the SEM"
Y. Kaduda, University of Guelph, Guelph, Ontario, Canada
"Microstructure on Age-Gelation of UHT Milk"
Session: Electron/Instrument Interaction Modeling in the
Scanning Electron Microscopy - A Workshop
Date & Time: AM & PM Thursday, April 11, 1995
Chair: Michael T. Postek
National Institute of Standards and Technology
Technology Building A347
Gaithersburg, MD 20899
J. Lowney, National Institute of Standards and Technology, Gaithersburg, MD,
A. Vladar, NIST, Gaithersburg, MD
D. Newbury, NIST, Gaithersburg, MD
Session: Applications of Scanning Microscopy in Forensic Science
Date & Time: AM & PM Thursday, April 11
Chair: S. Frank Platek
USFDA
National Forensic Chemistry Center
1141 Central Parkway, Cincinnati, OH 45202
S. Frank Platek, USFDA, National Forensic Chemistry Center, Cincinnati, OH
"Forensic Microscopy Analysis of Unique Cases Related to Food and Pharmaceutical
Tampering and Counterfeiting"
M.-J. Mann, National Fish and Wildlife Laboratory, Ashland, OR
"Application of Scanning Electron Microscopy to Forensic Firearms Examinations"
J.R. Millette, T.J. Hopen, MVA, Inc., Norcross, GA
"The Applications of Scanning Electron Microscopy Relating to Forensic and Environmental
Investigations"
Session: Atomic Force/Scanning Tunneling Microscopy Symposium
Date & Time: AM & PM Wednesday, April 10, 1996
AM & PM Thursday, April 11, 1996
Chair: Samuel H. Cohen
U.S. Army Soldier Systems Command
Natick Res., Development and Engineering Ctr.
SURD, R 315
Natick, MA 01760-5020
C. Brown, Worcester Polytechnic Institute, Worcester, MA
"Applications for Quantitative Analyses of Topographic Data Sets Using Scale-Sensitive
Fractal-based Methods"
E.C. Hammond, Morgan State University, Baltimore, MD
"SEM Analysis of a Typical Superconductor whose Constituents are Iron, Copper and
Barium"
M. Hietschold, Technical University of Chemnitz-Zwickau, Chemnitz, Germany
"Surface and Interface Spectroscopy With the STM"
T.L. Porter, Northern Arizona University, Flagstaff, AZ
"Scanning Probe Microscope Study of Hectorite and Montmorillonite Thin Films"
D. Yaniv, Molecular Imaging, Tempe, AZ
"Environmentally Controlled Scanning Probe Microscopy"
Session: Field Emission SEM in Biology
Time & Date: AM Thursday, April 11, 1996
Chair: Stanley L. Erlandsen
University of Minnesota Medical School
Dept. Cell Biology, 4-135 Jackson Hall
321 Church Street, SE, Minneapolis, MN 55455-0217
Tel: (612) 624-1491
Fax: (612) 624-8118
EMail: stan @ snowman.med.umn.edu
Session: Cryo-SEM
Date & Time: PM Thursday, April 11
Chair: Jacob Bastacky, University of California
1-116 Lawrence Berkeley Lab
Berkeley, CA 94720
Tel: (510) 486-4606, Fax: (510) 486-4750
EMail: sjbastacky@lbl.gov
W.P. Wergin, USDA, Beltsville, MD
"Metamorphism of Snow Crystals"
J. Bastacky, University of California, Berkeley, CA
"Low-temperature Scanning Electron Microscopy of Surfactant and the Liquid Lining Layer
in the Lungs"
Session: In situ Hybridization and In Situ PCR
Date & Time: AM Friday, April 12, 1996
Co-Chairs: Jiang Gu, Deborah Research Institute
Trenton, Pine-Mill Road, Browns Mills, NJ 08015
Tel: 609-893-1018, Fax: 609-893-2441
L. DeBault, Oklahoma University Health Center, Oklahoma City, OK
"In Situ Detection of DNA and mRNA"
J. Wilcox, Emory University, Atlanta, GA
"Non-radioisotope In Situ Hybridization"
J. Gu, Deborah Research Institute, Browns Mills, NJ
"Introduction to PCR and In Situ PCR"
O. Bagasra, Thoms Jefferson University Medical School, Philadelphia, PA
"Application of In Situ PCR in Research and Diagnosis"
Session: Semiconductor Device, Material and Process Characterization
Date & Time: AM & PM Friday, April 12, 1996
Co-Chairs: Bryan Tracy, Ph.D., Senior MTS/Section Manager
Materials Technology Development, Integrated Technology Division
Advanced Micro Devices, Mail Stop 32
One AMD Place, P. O. Box 3453, Sunnyvale, CA 94088
Tel: 408-732-2400, Voice Mail: 408-749-4819, Fax: 408-774-8812
Roger Alvis, Adavnced Micro Devices
One AMD Plaza, M/S 32, Sunnyvale, CA 94088
Tel: 408-749-3527, Fax: 408-774-8812
W.J. DeRuijter, EMi Spec Systems, Inc., Tempe, AZ
"Recent Developments in Computer Controlled Instrumentation and Real Time Image
Processing"
A. Erickson, Digital Instruments, Santa Barbara, CA
"Contributions of Scanning Probe Microscopies to Process Development and Device
Analysis"
E.I. Cole, Sandia National Laboratory, Albuquerque, NM
"Device Failure Analysis Techniques by Scanning Optical Microscopy"
ATOMIC FORCE/SCANNING TUNNELING MICROSCOPY SYMPOSIUM
Chair: Samuel H. Cohen
U.S. Army Soldier Systems Command
Natick Research, Development and Engineering Center
SURD, R 315, Natick, MA 01760-5020
Tel: 508-651-4578, Fax: 508-651-5223
Dr. Christopher Brown
Worcester Polytechnic Institute
Mechanical Engineering Department
100 Institute Road
Worcester, MA 01609-2280
Tel: 508-831-5627, Fax: 508-831-5178
Professor Ernest C. Hammond
Morgan State University
Department of Physics
Cold Spring Lane & Hillen Road
Baltimore, MD 21239
Tel: 410-319-3405, Fax: 410-319-3272
Dr. Michael Hietschold
Technical University of Chemnitz-Zwickau
Department of Physics
POB 964/D-09009
Chemnitz 09107, Germany
Tel: 011-49-371-5310-3201, 3203
Fax: 011-49-371-5310-3077
Dr. Timothy L. Porter
Northern Arizona University
Department of Physics
Box 6010
Flagstaff, AZ 86011
Tel: 602-523-2540, Fax: 602-523-1371
Dr. Daphna Yaniv
Molecular Imaging
1208 E. Broadway
Suite 110
Tempe, AZ 85282
Tel: 602-894-1653, Fax: 602-894-8750
Samuel H. Cohen will be the symposium chairperson and the organizers are: Christopher Brown, Worcester Polytechnic Institute, Worcester, MA, Ernest Hammond, Morgan State University, Baltimore, MD, Michael Hietschold, Technical University of Chemnitz-Zwickau, Chemnitz, Germany, Timothy Porter, Northern Arizona University, Flagstaff, AZ, and Daphna Yaniv, Molecular Imaging, Tempe, AZ.
Subjects of interest include but are not limited to the following: Fundamentals, Theory and Image Interpretation; Biological Sciences (including food); Materials Science and Technological Applications; Nanolithography - Atomic Manipulations and Micromachining; Semiconductor Characterization; Chemical Nanostructure; Methodologies and Techniques; New Developments/Frontiers in AFM/STM; Quantitative Analysis; Other Scanning Probe Methods.
SCANNING 96 will also include poster sessions and an extensive Exhibit Hall featuring the latest scientific equipment. The major scanning probe microscope companies will be exhibiting.
Submission Dates:
Abstracts of Papers - February 1, 1996
Posters - February 1, 1996 (identify topic and submit abstract)
Final Draft of Paper - April 9, 1996
Point of Contact:
Samuel H. Cohen Mary K. Sullivan
Symposium Chairman SCANNING 96
Phone: (508) 651-4578 Phone: (201) 818-1010
Fax: (508) 651-5223 Fax: (201) 818-0086
Novel approaches, new instrumentation, re-discovered techniques, and even clever sample preparation schemes in which scanned photons, electrons, ions or nano-probes are used to solve perplexing problems are appropriate for submission to this informing session. Authors are strongly encouraged to target process and device engineers, as well as instrumental analysts.
A tentative list of invited speakers includes Dr. W.J. DeRuijter, EMiSpec Systems, Tempe, AZ, discussing recent developments in computer controlled instrumentation and real time image processing; Andrew Erickson, Digital Instruments, Santa Barbara, CA, describing contributions of scanning probe microscopies to process development and device analysis; and Dr. E.I. Cole, Sandia National Laboratory, Albuquerque, NM, presenting device failure analysis techniques by scanning optical microscopy.
Submission Dates:
Abstracts of Papers - February 1, 1996
Posters - February 1, 1996 (identify topic and submit abstract)
Final Draft of Paper - April 9, 1996
Contact:
Roger Alvis/Bryan Tracy, Session Co-Chairs Mary K. Sullivan
Advanced Micro Devices, Inc. SCANNING 96
915 DeGuigne, MS 32 P. O. Box 832
Sunnyvale, CA 94088 Mahwah, NJ 07430
Phone: 408-732-2400 Phone: 201-818-1010
Fax: 408-774-8812 Fax: 201-818-0086