Atomic Force Microscope

Digital Instruments Multimode SPM with a Nanoscope III controller:

Surface probe microscopies (SPM) allow one to image the direct surface of a material with nanometer to sub-nanometer resolution. The Multimode capabilities include tapping mode atomic force microscopy (AFM), contact mode AFM, and scanning tunneling microscopy (STM). Two piezoelectric scanners are available for use with the Multimode; the J scanner is capable of measuring areas up to 120 μm x 120 μm with a vertical range of ~ 5 μm, and the E scanner is capable of imaging areas up to 10 μm x 10 μm with a vertical range of ~ 2.5 μm. Sample size is limited to a 10 mm in diameter in order to be easily mounted on the magnetic steel mounting disk.